
User Manual
254 i Series / iX Series
9.8.2.3 Specific Test Limitations and Discrepancies
While every effort has been made to provide comprehensive coverage of the Mil-Std 704 tests,
some limitations apply, largely due to hardware limitations of the iX power source. The following
table lists specific implementation issues by test number. The deviation from the standard
requirement is shown in the “Actual setting” column. The reason for the deviation is shown in the
last column.
.5Vp-v modulation (.3536V RMS)
3.5Vp-v modulation (2.475V RMS)
.5Vp-v modulation (.3536V RMS)
3.5Vp-v modulation (2.475V RMS)
Requires additional equipment
Requires additional equipment
Requires additional equipment
Requires additional equipment
Requires additional equipment
Requires additional equipment
Requires additional equipment
Requires additional equipment
Requires additional equipment
Dwell time = 1 cycle (16.666667 msec)
Dwell time = 1 cycle (16.666667 msec)
Dwell time = 1 cycle (16.666667 msec)
300VDC limit (test written but will not run)
Hardware limit DC range i/iX
300VDC limit (test written but will not run)
Hardware limit DC range i/iX
300VDC limit (test written but will not run)
Hardware limit DC range i/iX
300VDC limit (test written but will not run)
Hardware limit DC range i/iX
1
Note: To perform MIL-STD-704F tests HDC105-1, -3 and HDC302-1, -3, it is advised to use the firmware revision
E tests TRANSIENT and ABNORMAL respectively. The –704 firmware implementation overrides the DC voltage
range hardware limit making it possible for these tests to be performed. See section 9.8.1.8. The same does not
apply to the equivalent rev B or rev C tests, which require 475VDC. The 475 VDC level is not supported on the i/iX
Series.
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